Applied SmartFactory Solutions https://validator.w3.org/feed/docs/rss2.html Removing barriers to achieve higher levels of automation in the semiconductor industry Posts Factory Automation | Applied SmartFactory Solutions David Hanny Selim Nahas Yoram Barak, PhD DeShawn Jordan Amy Doucette, BChE, MEng Mike Wolfram Dr. Keith Smith Darren Whitaker MChem PhD MRSC Thomas Wimmer Nicole Xu Alina Xie Damon Tai, Ph.D. John Robinson Housman Chen Ravi Jaikumar Randy Corral Wei Wang Brandon Kurtz Yoshio Oikawa Shin Sekido Moti Rahamim Reiko Takashima Kohei Mizota Madhu Mamillapalli Eric Warren Jose Castaneda Samantha Duchscherer Rich Burda David Troiani, BChE, MBA, PE Amos Dor Jason Fung, <span style="display:inline-block;">MEng, AMIChemE</span> Madhav Kidambi Asaf Schlezinger Phong Nguyen Joerg Weigang Sven Espig Nicola Jones PhD, MRSc, MCIM Bing Wang Synergizing Fault Detection and SPC: smarter manufacturing solution for cost reduction Smarter alarm management: The hidden cost of alarm fatigue Scott D. Rothenberg Tirso BIGATA Pratik Kotcher Vishali Ragam Christopher Reeves Matthew Hurst, BEng AMIChemE John Mack, B.E., NZCE, CEng