SmartFactory Defect Classification

Replace manual and rule-based defect classification

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How do semiconductor manufacturers detect and classify defects in real time with high accuracy?

SmartFactory Defect Classification is a production proven, AI based solution that automatically detects and classifies inspection images into 100+ defect categories in semiconductor manufacturing. By replacing manual and rule based defect review, the solution improves classification accuracy, reduces cycle time, and enables consistent, scalable defect decisions across development, ramp, and high volume production.
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Why choose SmartFactory Defect Classification?

SmartFactory Defect Classification is designed for production scale deployment and addresses the limitations of manual and rules based defect classification systems.

Proven production results include:

0.3–1% yield recovery directly contributing to top-line revenue

Up to 90% reduction in person-to-machine ratios

Approximately 26% faster inspection-to-decision cycle time

These results enable manufacturers to improve operational consistency while reducing reliance on manual review.

What can you gain from our approach?

Production-scale automation

How SmartFactory Defect Classification automates defect classification at production scale:
  • SmartFactory Defect Classification automatically classifies inspection defects with greater than 90% automation, minimizing manual review effort.
  • The solution maintains a reported 0% escape rate, ensuring defects are consistently identified before downstream processing.
  • SmartFactory Defect Classification achieves greater than 97.5% accuracy across all defect classes in production environments, improving classification reliability.

Improved yield and cycle time

Automated defect classification improves manufacturing yield and inspection throughput.
  • SmartFactory Defect Classification helps recover measurable yield by enabling earlier, more consistent defect detection and disposition.
  • The solution shortens defect review queues, reducing inspection to decision cycle time during development, ramp, and high volume manufacturing.
  • SmartFactory Defect Classification improves inspection tool utilization, allowing manufacturers to defer or avoid additional scan tool capital expenditure.

Fab-wide intelligence through integration

How defect classification data is operationalized across the factory:
  • SmartFactory Defect Classification feeds defect results directly into yield analysis, disposition, and engineering workflows.
  • The solution integrates with SPC, FDC, and Run-to-Run Control systems to provide consistent defect context across quality and process control functions.
  • SmartFactory Defect Classification enables closed loop process control and faster root cause analysis by connecting inspection results to downstream corrective actions.

From defect detection to actionable process improvement

By combining AI driven defect classification with tight integration across fab systems, SmartFactory Defect Classification helps manufacturers move from defect detection to faster, more informed process decisions. The result is higher classification accuracy, reduced manual effort, and more effective use of defect data to support yield improvement, process control, and continuous manufacturing optimization.
Robotic arm placing a processor onto a motherboard on a neon-lit electronics manufacturing line.